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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">vsgiu</journal-id><journal-title-group><journal-title xml:lang="ru">Вестник Сибирского государственного индустриального университета</journal-title><trans-title-group xml:lang="en"><trans-title>Bulletin of the Siberian State Industrial University</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2304 - 4497</issn><issn pub-type="epub">2307-1710</issn><publisher><publisher-name>Федеральное государственное бюджетное образовательное учреждение высшего образования "Сибирский государственный индустриальный университет"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.57070/2304-4497-2025-2(52)-27-36</article-id><article-id custom-type="elpub" pub-id-type="custom">vsgiu-252</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Раздел 1. Физика конденсированного состояния</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Section 1. Condensed Matter Physics</subject></subj-group></article-categories><title-group><article-title>ВЛИЯНИЕ ИМПУЛЬСНОЙ ИОННО-ПУЧКОВОЙ ОБРАБОТКИ НА СТРУКТУРУ И СВОЙСТВА СПЛАВА, СФОРМИРОВАВШЕГОСЯ ПРИ ЭЛЕКТРОННО-ЛУЧЕВОЙ ПЕЧАТИ ПРОВОЛОКОЙ ВТ6св</article-title><trans-title-group xml:lang="en"><trans-title>INFLUENCE OF PULSED ION-BEAM TREATMENT ON THE STRUCTURE AND PROPERTIES OF THE ALLOY FORMED BY ELECTRON-BEAM PRINTING WITH VT6SV WIRE</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-6502-6541</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Хань</surname><given-names>Цзэли</given-names></name><name name-style="western" xml:lang="en"><surname>Han</surname><given-names>Zeli</given-names></name></name-alternatives><bio xml:lang="ru"><p>аспирант, инженер</p></bio><bio xml:lang="en"><p>postgraduate student, engineer</p></bio><email xlink:type="simple">hanzelizy@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-1515-4008</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ли</surname><given-names>Чжэнюань</given-names></name><name name-style="western" xml:lang="en"><surname>Li</surname><given-names>Zhengyuan</given-names></name></name-alternatives><bio xml:lang="ru"><p>д.т.н., доцент</p></bio><bio xml:lang="en"><p>Dr. Sci. (Eng.), Associate Professor</p></bio><email xlink:type="simple">zhengyuan-li@sylu.edu.cn</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-9366-5965</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тарбоков</surname><given-names>Владислав Александрович</given-names></name><name name-style="western" xml:lang="en"><surname>Tarbokov</surname><given-names>Vladislav A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>к.т.н., ведущий инженер</p></bio><bio xml:lang="en"><p>Cand. Sci. (Eng.), Leading Engi</p></bio><email xlink:type="simple">tarbokovv@tpu.ru</email><xref ref-type="aff" rid="aff-3"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8022-7958</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>Юрий Федорович</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanov</surname><given-names>Yurii F.</given-names></name></name-alternatives><bio xml:lang="ru"><p>д.ф.-м.н., ведущий научный сотрудник</p></bio><bio xml:lang="en"><p>Dr. Sci. (Phys. and Math.), Leading Researcher</p></bio><email xlink:type="simple">yufi55@mail.ru</email><xref ref-type="aff" rid="aff-4"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-8003-271X</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>Константин Вениаминович</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanov</surname><given-names>Konstantin V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>д.ф.-м.н., ведущий научный сотрудник</p></bio><bio xml:lang="en"><p>Dr. Sci. (Phys. and Math.), Leading Researcher</p></bio><email xlink:type="simple">ikv@ispms.tsc.ru</email><xref ref-type="aff" rid="aff-5"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-7583-0170</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Клименов</surname><given-names>Василий Александрович</given-names></name><name name-style="western" xml:lang="en"><surname>Klimenov</surname><given-names>Vasilii A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>д.т.н., профессор</p></bio><bio xml:lang="en"><p>Dr. Sci. (Eng.), Professor</p></bio><email xlink:type="simple">klimenov@tpu.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный исследовательский Томский политехнический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National Research Tomsk Polytechnic University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Шэньянский политехнический университет</institution><country>Russian Federation</country></aff><aff xml:lang="en"><institution>Shenyang Polytechnic University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-3"><aff xml:lang="ru"><institution>Национальный исследовательский Томский&#13;
политехнический университет</institution><country>Russian Federation</country></aff><aff xml:lang="en"><institution>National Research Tomsk Polytechnic University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-4"><aff xml:lang="ru"><institution>Институт сильноточной электроники СО РАН</institution><country>Russian Federation</country></aff><aff xml:lang="en"><institution>Institute of High-Current Electronics SB RAS</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-5"><aff xml:lang="ru"><institution>Институт физики прочности и материаловедения СО РАН</institution><country>Russian Federation</country></aff><aff xml:lang="en"><institution>Institute of Strength Physics and Materials Science SB RAS</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>07</day><month>07</month><year>2025</year></pub-date><volume>0</volume><issue>2</issue><fpage>27</fpage><lpage>36</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Хань Ц., Ли Ч., Тарбоков В.А., Иванов Ю.Ф., Иванов К.В., Клименов В.А., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Хань Ц., Ли Ч., Тарбоков В.А., Иванов Ю.Ф., Иванов К.В., Клименов В.А.</copyright-holder><copyright-holder xml:lang="en">Han Z., Li Z., Tarbokov V., Ivanov Y., Ivanov K., Klimenov V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://vestnik.sibsiu.ru/jour/article/view/252">https://vestnik.sibsiu.ru/jour/article/view/252</self-uri><abstract><p>Проведено исследование микроструктуры и свойств титанового сплава, сформировавшегося при электронно-лучевой печати проволокой ВТ6св, после обработки импульсным ионным пучком. Образцы были получены на лабораторной установке электронно-лучевого аддитивного производства, разработанной в ИФПМ СО РАН. Процесс формирования образцов осуществляли путем сплавления титановой сварочной проволоки марки ВТ6св диаметром 1,6 мм в условиях вакуума при давлении 10–3 ‒ 10–2 Па. Энергетическое воздействие с применением импульсной ионной обработки осуществляли на ускорителе ТЭМП-4М при ускоряющем напряжении 200 кВ, длительности импульса на половине максимума 100 нс и плотности энергии 2 Дж/см². Методами просвечивающей электронной микроскопии, атомно-силовой микроскопии и измерениями микротвердости установлено, что воздействие импульсного ионного пучка приводит к существенным изменениям в микроструктуре поверхности: наблюдается трансформация β-фазы в α-фазу, а также образование наночастиц интерметаллического соединения Al₃V. Толщина модифицированного слоя составляет около 5,5 мкм. Выявлено незначительное увеличение микротвердости (с 254,39 до 261,37 HV) при этом достигается более равномерное распределение значений твердости. Ионно-пучковая обработка может способствовать улучшению биосовместимости титановых имплантатов за счет устранения острых краев, возникающих в процессе механической обработки и снижения шероховатости. В сравнении с традиционными методами термического воздействия ионная обработка демонстрирует высокую степень управляемости и адаптивности, что делает ее перспективной для применения в медико-биологических системах. Полученные результаты открывают новые возможности функционализации поверхности титановых сплавов и обладают высоким прикладным потенциалом.</p></abstract><trans-abstract xml:lang="en"><p>A study of the microstructure and properties of a titanium alloy formed during electron beam printing with VT6cw wire after treatment with a pulsed ion beam has been carried out. The samples were obtained at a laboratory facility for electron beam additive manufacturing developed at IFPM SB RAS. The process of forming the samples was carried out by fusing titanium welding wire of the VT6sv brand with a diameter of 1.6 mm under vacuum conditions at a pressure of 10‒3 ‒ 10‒2 Pa. The energy effect using pulsed ion treatment was carried out on a TEMP-4M accelerator at an accelerating voltage of 200 kV, a pulse duration at half the maximum of 100 ns and an energy density of 2 J/cm2. Transmission electron microscopy, atomic force microscopy, and microhardness measurements have shown that exposure to a pulsed ion beam leads to significant changes in the microstructure of the surface: the transformation of the β-phase into the α-phase is observed, as well as the formation of nanoparticles of the Al₃v intermetallic compound. The thickness of the modified layer is about 5.5 microns. A slight increase in microhardness was revealed (from 254.39 to 261.37 HV), while a more uniform distribution of hardness values was achieved. Ion beam treatment can help improve the biocompatibility of titanium implants by eliminating sharp edges that occur during machining and reducing roughness. In comparison with traditional methods of thermal treatment, ion treatment demonstrates a high degree of controllability and adaptability, which makes it promising for use in biomedical systems. The results obtained open up new possibilities for the functionalization of the surface of titanium alloys and have high application potential.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>титановый сплав</kwd><kwd>сварочная проволока</kwd><kwd>электронно-лучевая печать</kwd><kwd>импульсный пучок</kwd><kwd>ионная обработка</kwd><kwd>структурные превращения</kwd><kwd>фазовые превращения</kwd><kwd>просвечивающая микроскопия</kwd></kwd-group><kwd-group xml:lang="en"><kwd>titanium alloy</kwd><kwd>welding wire</kwd><kwd>electron beam printing</kwd><kwd>pulsed beam</kwd><kwd>ion treatment</kwd><kwd>structural transformations</kwd><kwd>phase transformations</kwd><kwd>transmission electron microscopy</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Gaspar B. Microstructural characterization of Ti – 6Al – 4V and its relationship to sample ge-ometry. 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