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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">vsgiu</journal-id><journal-title-group><journal-title xml:lang="ru">Вестник Сибирского государственного индустриального университета</journal-title><trans-title-group xml:lang="en"><trans-title>Bulletin of the Siberian State Industrial University</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2304 - 4497</issn><issn pub-type="epub">2307-1710</issn><publisher><publisher-name>Федеральное государственное бюджетное образовательное учреждение высшего образования "Сибирский государственный индустриальный университет"</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.57070/2304-4497-2023-2(44)-28-39</article-id><article-id custom-type="elpub" pub-id-type="custom">vsgiu-147</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Раздел 2. Металлургия и материаловедение</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Section 2. Metallurgy and Materials Science</subject></subj-group></article-categories><title-group><article-title>МОДИФИКАЦИЯ СТРУКТУРЫ И МЕХАНИЧЕСКИХ СВОЙСТВ ОКСИДНОЙ КЕРАМИКИ ИОННОЙ ОБРАБОТКОЙ</article-title><trans-title-group xml:lang="en"><trans-title>MODIFICATION OF THE STRUCTURE AND MECHANICAL PROPERTIES OF OXIDE CERAMICS BY ION TREATMENT</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2524-9238</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гынгазов</surname><given-names>Сергей Анатольевич</given-names></name><name name-style="western" xml:lang="en"><surname>Ghyngazov</surname><given-names>Sergei</given-names></name></name-alternatives><bio xml:lang="ru"><p>д.т.н., ведущий научный сотрудник проблемной научной исследовательской лаборатории электроники  диэлектриков и полупроводников</p></bio><bio xml:lang="en"><p>Dr. Sci. (Tech.), Leading Re-searcher of the Problematic Research Laboratory of Electronics,</p></bio><email xlink:type="simple">ghyngazov@tpu.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8128-9042</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Болтуева</surname><given-names>Валерия Александровна</given-names></name><name name-style="western" xml:lang="en"><surname>Boltueva</surname><given-names>Valeriia</given-names></name></name-alternatives><bio xml:lang="ru"><p>к.т.н., младший научный сотрудник проблемной научной исследовательской лаборатории электроники, диэлектриков и полупроводников</p></bio><bio xml:lang="en"><p>Ph.D., Junior Researcher at the Problem Research Laboratory of Electronics, Dielectrics and Semiconductors</p></bio><email xlink:type="simple">kostenkova@tpu.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Национальный исследовательский Томский политехнический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Dielectrics and Semiconductors, National Research Tomsk Polytechnic University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Национальный исследовательский Томский политехнический университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>National Research Tomsk Poly-technic University.</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2023</year></pub-date><pub-date pub-type="epub"><day>30</day><month>06</month><year>2023</year></pub-date><volume>0</volume><issue>2</issue><fpage>28</fpage><lpage>39</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Гынгазов С.А., Болтуева В.А., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Гынгазов С.А., Болтуева В.А.</copyright-holder><copyright-holder xml:lang="en">Ghyngazov S., Boltueva V.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://vestnik.sibsiu.ru/jour/article/view/147">https://vestnik.sibsiu.ru/jour/article/view/147</self-uri><abstract><p>Представлены результаты исследования влияния ионной (аргон, углерод, азот, ксенон) обработки при различных параметрах пучка (энергии ионов, плотностях тока и энергии, флюенсах, режимов облучения) на физико-механические свойства (структура, фазовый состав, микротвердость) керамики на основе частично стабилизированного диоксида циркония и оксида алюминия. Установлены закономерности структурных и фазовых превращений, эффектов поверхностной модификации циркониевой и алюмооксидной керамики при воздействии ускоренными ионами. Рентгенофазовый анализ показал, что ионная (аргон, азот, ксенон) обработка независимо от режима (непрерывный, импульсный) в поверхностном слое керамики на основе частично стабилизированного диоксида циркония приводит к фазовой перестройке на глубине порядка 15 мкм. Согласно данным сканирующей электронной микроскопии непрерывные ионные пучки (аргон, ксенон) не приводят к морфологическим изменениям поверхностного слоя оксидной керамики. Воздействие импульсных ионных (углерод, азот) пучков приводит к кратковременным процессам плавления и затвердевания, в результате чего в поверхностном слое оксидной керамики формируется структура, отличающаяся от структуры в объеме керамики. Независимо от режима и параметров пучка ионная обработка приводит к увеличению микротвердости поверхности керамики из частично стабилизированного диоксида циркония и оксида алюминия.</p></abstract><trans-abstract xml:lang="en"><p>The results of the study of the effect of ion (argon, carbon, nitrogen, xenon) treatment at various beam parameters (ion energy, current density, energy density, fluence, irradiation modes) on the physical and mechanical properties (structure, phase composition, microhardness) of ceramics based on partially stabilized zirconia and alumina are presented. The regularities of structural and phase transformations, the effects of surface modification of zirconia and alumina ceramics when exposed to accelerated ions are established. X-ray phase analysis showed that ion (argon, nitrogen, xenon) treatment, regardless of the mode (continuous, pulsed) in the surface layer of ceramics based on partially stabilized zirconia, leads to phase rearrangement at a depth of about 15 μm. According to scanning electron microscopy continuous ion beams (argon, xenon) do not lead to morphological changes in the surface layer of oxide ceramics. The impact of pulsed ion (carbon, nitrogen) beams leads to short-term melting and solidification processes, as a result of which a structure is formed in the surface layer of oxide ceramics which differs from the structure in the volume of ceramics. Regardless of the beam mode and parameters, ion treatment leads to an increase in the microhardness of the ceramic surface from of partially stabilized zirconia and alumina.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>ионная обработка</kwd><kwd>частично стабилизированный диоксид циркония</kwd><kwd>оксид алюминия</kwd><kwd>рентгеновская дифракция</kwd><kwd>микротвердость</kwd><kwd>электронная и просвечивающая микроскопия</kwd></kwd-group><kwd-group xml:lang="en"><kwd>ion treatment</kwd><kwd>partially stabilized zirconia</kwd><kwd>alumina</kwd><kwd>x-ray diffraction</kwd><kwd>microhardness</kwd><kwd>electron and transmission microscopy</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена при финансовой поддержке Министерства науки и высшего образования Российской Федерации в рамках государственного задания в сфере научной деятельности (проект FSWW-2023-0011).</funding-statement><funding-statement xml:lang="en">the work was supported by the Ministry of Science and Higher Education of the Russian Federation within the framework of the state task in the field of scientific activity (рroject FSWW-2023-0011).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Зацепин Д.А., Чолах С.О., Вайнштейн И.А. 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